The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2014

Filed:

Oct. 30, 2008
Applicant:

George W. Conner, Camarillo, CA (US);

Inventor:

George W. Conner, Camarillo, CA (US);

Assignee:

Teradyne, Inc., North Reading, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 7/60 (2006.01);
U.S. Cl.
CPC ...
Abstract

In some implementations, a method for testing is provided, which includes simulating a functional operational environment for a first type device-under-test with a tester. This includes recognizing a non-deterministic response signal having a predetermined protocol, receiving the non-deterministic response signal from the first type device-under-test, ascertaining an expected stimulus signal to be transferred to the first type device-under-test from the non-deterministic response signal based on the predetermined protocol, and initiating transmission of the expected stimulus signal to the first type device-under-test. The method further includes simulating a functional operational environment for a second type device-under-test with the tester after testing the first type device-under-test.


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