The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

May. 18, 2011
Applicants:

Scott Filler, Santa Clara, CA (US);

Hendrik Jan (Erik) Volkerink, Palo Alto, CA (US);

Ahmed Sami Tantawy, San Jose, CA (US);

Inventors:

Scott Filler, Santa Clara, CA (US);

Hendrik Jan (Erik) Volkerink, Palo Alto, CA (US);

Ahmed Sami Tantawy, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/319 (2006.01); G01R 31/28 (2006.01); G06F 11/263 (2006.01); G06F 11/273 (2006.01); G06F 17/00 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31908 (2013.01); G01R 31/2834 (2013.01); G06F 11/263 (2013.01); G06F 11/2733 (2013.01); G06F 17/00 (2013.01); G11C 29/56 (2013.01);
Abstract

A system for use in automated test equipment. In one embodiment, the system includes a configurable integrated circuit (IC) programmable to provide test patterns for use in automated test equipment. The configurable IC includes a configurable interface core that is programmable to provide functionality of one or more protocol based interfaces for a device under test (DUT) and is programmable to interface with the DUT. The system also includes a connection configurable to couple the configurable IC to the DUT.


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