The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2014
Filed:
Nov. 04, 2011
Applicants:
Wayne C. Goeke, Hudson, OH (US);
William Knauer, Chagrin Falls, OH (US);
Inventors:
Wayne C. Goeke, Hudson, OH (US);
William Knauer, Chagrin Falls, OH (US);
Assignee:
Keithley Instruments, Inc., Cleveland, OH (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/02 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 1/18 (2006.01); G01R 1/00 (2006.01); G01R 31/319 (2006.01); G01R 3/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06766 (2013.01); G01R 1/073 (2013.01); G01R 1/18 (2013.01); G01R 1/00 (2013.01); G01R 31/31926 (2013.01); G01R 3/00 (2013.01);
Abstract
A DC-AC probe card for testing a DUT includes: a plurality of probe needles, each probe needle having a distal end for contacting said DUT; and a plurality of connection pathways operable to connect test instrumentation to the probe needles, wherein each connection pathway provides both a desired characteristic impedance for AC measurements and a guarded pathway for DC measurements between respective test instrument connections and probe needles.