The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2014
Filed:
Aug. 09, 2011
Adrian E. Ong, Pleasanton, CA (US);
Paul Fuller, Ketchum, ID (US);
Nick Van Heel, Eagle, ID (US);
Mark Thomann, Boise, ID (US);
Adrian E. Ong, Pleasanton, CA (US);
Paul Fuller, Ketchum, ID (US);
Nick van Heel, Eagle, ID (US);
Mark Thomann, Boise, ID (US);
Rambus Inc., Sunnyvale, CA (US);
Abstract
Methods, systems, and apparatus for testing semiconductor devices. A semiconductor device includes one or more external terminals configured to receive fuse configuration data from an external source. The semiconductor device also includes a soft-blow circuit to generate a soft-blow signal based on the fuse configuration data, and a fuse circuit that includes a fuse and has first and second operational states corresponding to the fuse being intact and blown, respectively. The fuse circuit is configured to receive the soft-blow signal and to select its operational state to be the first or second operational state based on the received soft-blow signal.