The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2014
Filed:
Dec. 07, 2012
Synopsys, Inc., Mountain View, CA (US);
Jiayong Le, Sunnyvale, CA (US);
Feroze P. Taraporevala, Los Altos, CA (US);
Synopsys, Inc., Mountain View, CA (US);
Abstract
A dual-box location-based on-chip variation (DBLOCV) can be used in STA to significantly reduce pessimism. The DBLOCV analysis includes forming a backward bounding box and a forward bounding box for a cell of the design. A first intermediate maximum distance from the cell to corners of the backward bounding box can be calculated using the coordinates. A second intermediate maximum distance from the cell to corners of the forward bounding box can be calculated using the coordinates. A derate value can be determined from the derate table using the maximum distance of the first and second intermediate maximum distances. STA can be performed using the derate value. At least one timing report can be generated based on the STA.