The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2014
Filed:
Jun. 20, 2012
Applicants:
Masuyuki Sugiyama, Hino, JP;
Yuichiro Hashimoto, Tachikawa, JP;
Shun Kumano, Kokubunji, JP;
Yohei Kawaguchi, Hachioji, JP;
Hidetoshi Morokuma, Hitachinaka, JP;
Inventors:
Masuyuki Sugiyama, Hino, JP;
Yuichiro Hashimoto, Tachikawa, JP;
Shun Kumano, Kokubunji, JP;
Yohei Kawaguchi, Hachioji, JP;
Hidetoshi Morokuma, Hitachinaka, JP;
Assignee:
Hitachi High-Technologies Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/42 (2006.01); H01J 49/26 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A mass spectrometry method that corrects the effects from space charge and that achieves both sensitivity and a dynamic range. The mass axis of the mass spectrum is corrected based on the counts of ions accumulated within the ion trap at the point in time each ion was extracted.