The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2014

Filed:

May. 28, 2010
Applicants:

Kathryn A. Engholm, Portland, OR (US);

John F. Turpin, Tigard, OR (US);

Inventors:

Kathryn A. Engholm, Portland, OR (US);

John F. Turpin, Tigard, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/16 (2006.01); G01R 13/32 (2006.01); G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
G01R 13/0263 (2013.01);
Abstract

A test and measurement instrument converts digital data that represents an input signal into a plurality of bitmaps, and then subtracts one of the bitmaps from another one of the bitmaps to produce a difference bitmap. The difference bitmap does not contain density values that are common to the two bitmaps, but instead only contains the density differences between the two, thereby revealing very small density variations in the presence of large density values. In some embodiments, the difference bitmap is displayed on a display device. In other embodiments, the difference bitmap is used to generate a trigger signal.


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