The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2014
Filed:
Jul. 23, 2008
Yuk-ming Dennis Lo, Kowloon, HK;
Rossa Wai Kwun Chiu, New Territories, HK;
Kwan Chee Chan, Kowloon, HK;
Benny Chung Ying Zee, New Territories, HK;
Ka Chun Chong, New Territories, HK;
Yuk-Ming Dennis Lo, Kowloon, HK;
Rossa Wai Kwun Chiu, New Territories, HK;
Kwan Chee Chan, Kowloon, HK;
Benny Chung Ying Zee, New Territories, HK;
Ka Chun Chong, New Territories, HK;
The Chinese University of Hong Kong, Shatin, N.T., Hong Kong, CN;
Abstract
Methods, systems, and apparatus are provided for determining whether a nucleic acid sequence imbalance exists within a biological sample. One or more cutoff values for determining an imbalance of, for example, the ratio of the two sequences (or sets of sequences) are chosen. The cutoff value may be determined based at least in part on the percentage of fetal DNA in a sample, such as maternal plasma, containing a background of maternal nucleic acid sequences. The cutoff value may also be determined based on an average concentration of a sequence per reaction. In one aspect, the cutoff value is determined from a proportion of informative wells that are estimated to contain a particular nucleic acid sequence, where the proportion is determined based on the above-mentioned percentage and/or average concentration. The cutoff value may be determined using many different types of methods, such as sequential probability ratio testing (SPRT).