The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2014
Filed:
Dec. 02, 2010
Sundeep Vaddadi, San Diego, CA (US);
John H. Hong, San Diego, CA (US);
Onur C. Hamsici, San Diego, CA (US);
Yuriy Reznik, San Diego, CA (US);
Chong U. Lee, San Diego, CA (US);
Sundeep Vaddadi, San Diego, CA (US);
John H. Hong, San Diego, CA (US);
Onur C. Hamsici, San Diego, CA (US);
Yuriy Reznik, San Diego, CA (US);
Chong U. Lee, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
A method for feature matching in image recognition is provided. First, image scaling may be based on a feature distribution across scale spaces for an image to estimate image size/resolution, where peak(s) in the keypoint distribution at different scales is used to track a dominant image scale and roughly track object sizes. Second, instead of using all detected features in an image for feature matching, keypoints may be pruned based on cluster density and/or the scale level in which the keypoints are detected. Keypoints falling within high-density clusters may be preferred over features falling within lower density clusters for purposes of feature matching. Third, inlier-to-outlier keypoint ratios are increased by spatially constraining keypoints into clusters in order to reduce or avoid geometric consistency checking for the image.