The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2014
Filed:
Dec. 15, 2011
Kathryn A. Engholm, Portland, OR (US);
Marcus K. Da Silva, Portland, OR (US);
Kathryn A. Engholm, Portland, OR (US);
Marcus K. Da Silva, Portland, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A test and measurement instrument includes an input for receiving an input test signal and a separator that separates a data array of the input test signal into a number of different data bins. Each data bin includes a number of data points. A selector is included that determines whether the data points within a present bin of the total bins represent signal or noise. When the present bin contains noise, a processor generates a first output for the present bin. Instead, when the present bin contains signal, the processor generates a second output for the present bin. The bin outputs can then be combined to make an output array, such as a waveform display, for the instrument.