The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2014
Filed:
Jul. 25, 2011
Tetsuya Nishida, Hitachinaka, JP;
Tetsuya Nishida, Hitachinaka, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
Provide is an ion trap mass spectrometer which is configured to gain an MS spectrum of only fragment data in an MS/MS analysis, thereby makes it possible to perform the analysis in a short period. For this purpose, the device is comprised of: an ionization unit configured to ionize a sample which has been separated into respective components; an ion trap unit configured to trap ions ionized by ionization unit in an electric field and eject the ions in accordance with the respective masses of the ions; a detection unit configured to detect the ions ejected from the ion trap unit; and a processing unit configured to generate an MS spectrum (mass spectrum) on the basis of data detected in the detection unit. The processing unit further configured to gain an MS spectrum of only fragment data of a target ion from a difference between an MS spectrum gained in an MS analysis made before and/or after an MS/MS analysis and an MS spectrum gained in the MS/MS analysis.