The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2014

Filed:

Aug. 04, 2011
Applicants:

Eldad Langmatz, Haifa, IL;

Shimon Koren, Haifa, IL;

Menachem Regensburger, Shimshit, IL;

Zehava Ben-ezer, Moshav Balfuria, IL;

Inventors:

Eldad Langmatz, Haifa, IL;

Shimon Koren, Haifa, IL;

Menachem Regensburger, Shimshit, IL;

Zehava Ben-Ezer, Moshav Balfuria, IL;

Assignee:

Camtek Ltd., Migdal Haemek, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

System, computer readable medium and method. The system includes (i) a data obtaining module arranged to obtain data about at least one portion of an inspected article; and (ii) a processor arranged to perform at least one processing operation of the data out of: (a) processing the data to provide the inspection recipe; and (b) processing the data, while utilizing the inspection recipe, to detect defects; wherein the inspection recipe comprises multiple zones of multiple types of zones; wherein a zone of a first type of zones differs from a zone of a second type of zone.


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