The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2014
Filed:
Jun. 28, 2011
Kazuyuki Matsushita, Ome, JP;
Takuto Sakumura, Hachioji, JP;
Yuji Tsuji, Hamura, JP;
Masataka Maeyama, Ome, JP;
Kimiko Hasegawa, Hamura, JP;
Kazuyuki Matsushita, Ome, JP;
Takuto Sakumura, Hachioji, JP;
Yuji Tsuji, Hamura, JP;
Masataka Maeyama, Ome, JP;
Kimiko Hasegawa, Hamura, JP;
Rigaku Corporation, Akishima-Shi, Tokyo, JP;
Abstract
A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement. Data of diffracted X-rays of different wavelengths are acquired using the entire region of the receiving surface of a two-dimensional detector.