The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2014
Filed:
Apr. 04, 2008
Helmut Lippert, Jena, DE;
Christopher Power, Jena, DE;
Christian Dietrich, Jena, DE;
Benno Radt, Jena, DE;
Helmut Lippert, Jena, DE;
Christopher Power, Jena, DE;
Christian Dietrich, Jena, DE;
Benno Radt, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A sample holding system for a microscope, including a sample chamber which has an upper opening and is filled with an immersion liquid, and in which a sample embedded in a transparent embedding compound is placed in a holder. Translatory movement of the sample in relation to a detection objective of the microscope, and rotating the sample about an essentially vertical rotational axis in a plane forming an angle different from zero with the optical axis of the detection objective is included. Rotating the sample includes a rotational drive provided with a magnetic coupling or a belt drive and/or toothed wheel rotational drive arranged above the sample chamber.