The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2014
Filed:
Sep. 14, 2011
Kenichi Ohtsuka, Hamamatsu, JP;
Tetsuhisa Nakano, Hamamatsu, JP;
Kenichi Ohtsuka, Hamamatsu, JP;
Tetsuhisa Nakano, Hamamatsu, JP;
Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
A reflectivity measuring deviceincludes a measurement light sourcethat supplies irradiation light Lto a measurement object, a spectroscopic detection unitthat detects, at multi-wavelength, intensity of the irradiation light Land intensity of reflected light Lfrom the measurement object, a coefficient recording unitthat records a conversion coefficient K(λ) for converting a detected value of each wavelength's intensity of the irradiation light Linto a value corresponding to a detected value of each wavelength's intensity of reflected light Lfrom a reference measurement object, and a reflectivity calculation unitthat calculates each wavelength's reflectivity based on the value corresponding to the each wavelength's intensity of the reflected light Lfrom the reference measurement object obtained from the detected value of the each wavelength's intensity of the irradiation light Land the conversion coefficient K(λ).