The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2014

Filed:

Jan. 08, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jeanne P. S. Bickford, Essex Junction, VT (US);

Donald S. Kent, Essex Junction, VT (US);

Gerard John Nuzback, Hopewell Junction, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Various embodiments include computer-implemented methods, computer program products and systems for terminal metal connector inspection. In some embodiments, a computer-implemented method for identifying a set of critical terminal metal connectors (TMCs) in an integrated circuit (IC) layout includes: identifying a group of necessary terminal metal connectors (TMCs) in the IC layout to form a first portion of the set of critical TMCs; forming a rule including a limit on a number of redundant connections that can be noncompliant between each terminal metal connector (TMC) and a connecting surface in the IC layout without impacting a circuit parameter; and inspecting at least one of the IC layout or the connecting surface to identify each TMC that violates the rule, wherein each identified TMC that violates the rule forms a second portion of the set of critical TMCs.


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