The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2014

Filed:

May. 07, 2007
Applicants:

Steven G. Esposito, Westford, MA (US);

Kiran Chhabra, New Delhi, IN;

Saran Prasad, New Delhi, IN;

D. Scott Baeder, Auburn, MA (US);

Inventors:

Steven G. Esposito, Westford, MA (US);

Kiran Chhabra, New Delhi, IN;

Saran Prasad, New Delhi, IN;

D. Scott Baeder, Auburn, MA (US);

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test object can be selectively included in a test run based on predicting the behavior of the test object. In one embodiment, the present invention includes predicting how likely the test object is to produce a failure in a test run and deciding whether to include the test object in the test run based on the predicted likelihood. This likelihood of producing a failure may be based on any number of circumstances. For example, these circumstances may include the history of prior failures and/or the length of time since the test object was last included in a test run.


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