The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2014
Filed:
Sep. 11, 2009
Mina Rezk, Bristow, VA (US);
Anthony Slotwinski, Woodbridge, VA (US);
Mina Rezk, Bristow, VA (US);
Anthony Slotwinski, Woodbridge, VA (US);
Nikon Metrology N.V., Leuven, BE;
Abstract
A system and method for determining a measured distance between a measuring device (A) and an object (), the system including a first laser source () for producing a first light beam (A) having a first waveform () and a first frequency; a second laser source () for producing a second light beam (IA) having a second frequency, said second light beam (HA) having a second waveform (), wherein said first frequency is chirped up at the first rate as said second frequency is chirped down at the first rate, and said second frequency is chirped up at the second rate as said first frequency is chirped down at the first rate; an optical element () for combining said first light beam (A) with said second light beam (HA) into a combined light beam path (), said optical element () splitting a returning portion of said combined light beam path () into a third light beam (); and a single detector () for receiving said third light beam () including two different beat frequencies that are proportional to the measured distance.