The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
Nov. 21, 2012
Applicant:
Cadence Design Systems, Inc., San Jose, CA (US);
Inventors:
Assignee:
Cadence Design Systems, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract
A apparatus and method for conducting fault sensitivity analysis of the analog portions of a mixed signal circuit design includes simulating the fault free circuit design, inserting a fault into the analog portion of the circuit design, simulating the circuit design with the fault during a fault interval time period, and determining whether the fault is detectable.
O'Riordan, Donald. (2014). System and method for fault sensitivity analysis of mixed-signal integrated circuit designs (U.S. Patent No. 8683400). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8683400
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile