The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
Jun. 16, 2008
Eran Steinberg, San Francisco, CA (US);
Petronel Bigioi, Galway, IE;
Adrian Zamfir, Bucharest, RO;
Alexandru Drimbarean, Galway, IE;
Peter Corcoran, Galway, IE;
Stefan Petrescu, Bucharest, RO;
Emilian David, Bucharest, RO;
Constantin Vertan, Bucharest, RO;
Eran Steinberg, San Francisco, CA (US);
Petronel Bigioi, Galway, IE;
Adrian Zamfir, Bucharest, RO;
Alexandru Drimbarean, Galway, IE;
Peter Corcoran, Galway, IE;
Stefan Petrescu, Bucharest, RO;
Emilian David, Bucharest, RO;
Constantin Vertan, Bucharest, RO;
DigitalOptics Corporation Europe Limited, Ballybrit, Galway, IE;
Abstract
A digital image processing technique is for detecting and correcting visual imperfections using a reference image. A main image and one or more reference images having a temporal and/or spatial overlap and/or proximity with the original image are captured. Device information, image data and/or meta data are analyzed of the one or more reference images relating to a defect in the main image. The device corrects the defect based on the information, image data and/or meta-data to create an enhanced version of the main image.