The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2014

Filed:

Jun. 04, 2010
Applicants:

Satoshi Takahashi, Hitachinaka, JP;

Tsuyoshi Sonehara, Kokubunji, JP;

Takanobu Haga, Kokubunji, JP;

Inventors:

Satoshi Takahashi, Hitachinaka, JP;

Tsuyoshi Sonehara, Kokubunji, JP;

Takanobu Haga, Kokubunji, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a method and an apparatus for easily identifying and detecting fluorescent material types captured in respective reaction regions of a substrate, particularly, a method and an apparatus for identifying and measuring the fluorescence intensities of a plurality of fluorescent materials using a small pixel count. The fluorescence intensities of four or more types of fluorescent materials are divided by a dividing section at ratios different at least for each fluorescence maximum wavelength range, and are detected by at least one detector including pixels for detecting the light fluxes divided at the different ratios. The type of the fluorescent material is determined on the basis of the ratio of the detected fluorescence intensity of the same detection portion, and the fluorescence intensity is measured.


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