The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Jul. 03, 2013
Fei Company, Hillsboro, OR (US);
Rudolf Johannes Peter Gerardus Schampers, Tegelen, NL;
Michael Frederick Hayles, Eindhoven, NL;
Dirk Arie Mattheus de Winter, Utrecht, NL;
Christianus Thomas Wilhelmus Maria Schneijdenberg, Utrecht, NL;
FEI Company, Hillsboro, OR (US);
Abstract
A method of forming a sample from a capillary with high-pressure frozen sample material comprises providing a high-pressure capillary with vitrified sample material at a temperature Tbelow the glass transition temperature T, cutting the capillary, warming the capillary to a temperature Tbetween temperature Tand temperature T, cooling the capillary to a temperature Tbelow temperature T, as a result of which material is extruded from the capillary, and freeing a sample from the extruded sample material at a temperature below temperature T. Repeating this temperature cycle results in further extrusion of the sample material. The extruded material can then be sliced by, for example, ion beam milling.