The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2014

Filed:

Aug. 09, 2012
Applicants:

Jin Choi, Yongin-si, KR;

Byung-gook Kim, Seoul, KR;

Hee-bom Kim, Hwaseong-si, KR;

Sang-hee Lee, Yongin-si, KR;

Inventors:

Jin Choi, Yongin-si, KR;

Byung-Gook Kim, Seoul, KR;

Hee-Bom Kim, Hwaseong-si, KR;

Sang-Hee Lee, Yongin-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-Si, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/38 (2012.01);
U.S. Cl.
CPC ...
Abstract

A method for manufacturing a photomask includes forming a photoresist film on a substrate, and forming a defect detecting pattern on the photoresist film. The defect detecting pattern has a first pattern elongated in a first direction and a second pattern overlapping one end of the first pattern and elongated in a second direction different from the first direction. The first pattern and the second pattern are formed using electron beams (e-beam) diffracted by a same amplifier.


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