The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2014
Filed:
Nov. 09, 2012
Jasper Designs Automation, Inc., Mountain View, CA (US);
Craig Franklin Deaton, Rowlett, TX (US);
Jasper Design Automation, Inc., Mountain View, CA (US);
Abstract
A first signal trace is received including signal values satisfying a target event. A first trace signature is generated describing a portion of the first signal trace that causes the target event to occur. A second signal trace is generated that includes signal values satisfying the target event. A second trace signature is generated describing a portion of the second signal trace that causes the target event to occur. Differential signal events are determined that differentiate the first trace signature from the second trace signature. The differential signal events are events from the first signal trace that cause the target event to occur, but do not appear in the second trace signature. The process can be repeated to receive a plurality of signal traces, and to generate a plurality of signal traces. The differential signal events are indexed in a datastore in association with the signal traces.