The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2014

Filed:

Aug. 05, 2011
Applicants:

Seiichi Aritome, Sungnam, KR;

Soojin WI, Icheon-si, KR;

Angelo Visconti, Appiano Gentile, IT;

Silvia Beltrami, Bartolomeo, IT;

Christian Monzio Compagnoni, Olgiate Olona, IT;

Alessandro Sottocornola Spinelli, Bergamo, IT;

Inventors:

Seiichi Aritome, Sungnam, KR;

Soojin Wi, Icheon-si, KR;

Angelo Visconti, Appiano Gentile, IT;

Silvia Beltrami, Bartolomeo, IT;

Christian Monzio Compagnoni, Olgiate Olona, IT;

Alessandro Sottocornola Spinelli, Bergamo, IT;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for program verify is disclosed, such as one in which a threshold voltage of a memory cell that has been biased with a programming voltage can be determined and its relationship with multiple program verify voltage ranges can be determined. The program verify voltage range in which the threshold voltage is located determines the subsequent bit line voltage. The subsequent bit line voltage may be less than a previous bit line voltage used to program the memory cell.


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