The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2014
Filed:
Nov. 14, 2011
Jong-kyu Hong, Gwangju-si, KR;
Monn-young Jeon, Seoul, KR;
Hong-min Kim, Seoul, KR;
Jung Hur, Bucheon-si, KR;
Sang-kyu Yun, Chungju-si, KR;
Jong-Kyu Hong, Gwangju-si, KR;
Monn-Young Jeon, Seoul, KR;
Hong-Min Kim, Seoul, KR;
Jung Hur, Bucheon-si, KR;
Sang-Kyu Yun, Chungju-si, KR;
Koh Young Technology Inc., Seoul, KR;
Abstract
An inspection apparatus includes a work stage part, an optical module, and an optical module moving part. The work stage part receives a board. The work stage part includes work stages disposed in parallel. The optical module includes a projecting part disposed over the board, an image capturing part disposed at a side portion of the projecting part to receive the grating pattern light and capture a reflection image, and an optical path changing part changing a path of the grating pattern light and guiding the grating pattern light to the image capturing part so that the grating pattern light is downwardly incident into the image capturing part. The optical module moving part is disposed over and coupled to the optical module to move the optical module. Thus, time may be reduced and a space may be secured, required for inspecting a board.