The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2014
Filed:
May. 26, 2009
Applicants:
Sybren Sijbrandij, Wakefield, MA (US);
John Notte, Iv, Gloucester, MA (US);
William B. Thompson, Los Altos, CA (US);
Inventors:
Sybren Sijbrandij, Wakefield, MA (US);
John Notte, IV, Gloucester, MA (US);
William B. Thompson, Los Altos, CA (US);
Assignee:
Carl Zeiss Microscopy, LLC, Thornwood, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
The disclosure relates to sample inspection using an ion-beam microscope. In some embodiments, the disclosure involves the use of multiple detectors, each of which provides different information about a sample.
Sijbrandij, Sybren. (2014). Sample inspection methods, systems and components (U.S. Patent No. 8669525). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8669525
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile