The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2014

Filed:

May. 16, 2012
Applicants:

Haizhou Yin, Poughkeepsie, NY (US);

Zhijiong Luo, Poughkeepsie, NY (US);

Huilong Zhu, Poughkeepsie, NY (US);

Da Yang, Beijing, CN;

Inventors:

Haizhou Yin, Poughkeepsie, NY (US);

Zhijiong Luo, Poughkeepsie, NY (US);

Huilong Zhu, Poughkeepsie, NY (US);

Da Yang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01); H01L 21/425 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for manufacturing a semiconductor device is provided. The method comprises providing a semiconductor substrate; forming a dummy gate structure and a spacer surrounding the dummy gate structure on the semiconductor substrate; forming source/drain regions on both sides of the gate structure within the semiconductor substrate using the dummy gate structure and the spacer as a mask; forming an interlayer dielectric layer on the upper surface of the semiconductor substrate, the upper surface of the interlayer dielectric layer being flush with the upper surface of the dummy gate structure; removing at least a part of the dummy gate structure so as to form a trench surrounded by the spacer; performing tilt angle ion implantation into the semiconductor substrate using the interlayer dielectric layer and spacer as a mask so as to form an asymmetric Halo implantation region; sequentially forming a gate dielectric layer and a metal gate in the trench.


Find Patent Forward Citations

Yin, Haizhou. (2014). Method for manufacturing a semiconductor device (U.S. Patent No. 8669160). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8669160

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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