The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2014
Filed:
Apr. 05, 2011
Kazuyuki Ogura, Yao, JP;
Masahiro Okitsu, Higashiosaka, JP;
Youichi Ogawa, Tachikawa, JP;
Kyu Takada, Otsu, JP;
Kazuyuki Ogura, Yao, JP;
Masahiro Okitsu, Higashiosaka, JP;
Youichi Ogawa, Tachikawa, JP;
Kyu Takada, Otsu, JP;
Konica Minolta Advanced Layers, Inc., Tokyo, JP;
Abstract
In an eccentricity measuring method according to the present invention, a first position of a light source image formed by reflection at one optical surface is measured (S), a predetermined second position related to another optical surface is measured (S), and a relative eccentricity between both optical surfaces is calculated based on the first and second positions (S). Therefore, the eccentricity measuring method enables measurement of eccentricity by a same measurement optical system regardless of a radius of curvature of an optical surface of an optical element.