The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2014

Filed:

Jun. 28, 2012
Applicants:

Michael Buhot, Brisbane, AU;

Van Hung Phan, Chapel Hill, AU;

Michael James Owen, Geebung, AU;

Inventors:

Michael Buhot, Brisbane, AU;

Van Hung Phan, Chapel Hill, AU;

Michael James Owen, Geebung, AU;

Assignee:

FEI Company, Hillsboro, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G21K 7/00 (2006.01);
U.S. Cl.
CPC ...
G21K 7/00 (2013.01);
Abstract

The present invention discloses a method for determining the mineral content represented by the entire SEM-EDS dataset, including initially unknown data points. SEM-EDS data points are taken and compared to a set of known data points. Any data point that is not sufficiently similar to the known data point is classified as unknown and clustered with like unknown data points. After all data points are analyzed, any clusters of unknown data points with a sufficient number of data points are further analyzed to determine their characteristics. All clusters of unknown data points with an insufficient number of data points to allow further analysis are considered outliers and discarded.


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