The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2014

Filed:

Nov. 12, 2007
Applicant:

Miles Dudman, Mountain View, CA (US);

Inventor:

Miles Dudman, Mountain View, CA (US);

Assignee:

Micrel, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A01H 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates generally to semiconductor wafer fabrication and more particularly but not exclusively to advanced process control methodologies for controlling oxide formation using pressure. The present invention, in one or more implementations, includes a pressure stabilization system to dynamically adjust scavenger pressure in a furnace during wafer fabrication in relation to a pressure formation range, value, or one or more pressure indicators in a wafer fabrication process.


Find Patent Forward Citations

Dudman, Miles. (2014). System for improved pressure control in horizontal diffusion furnace scavenger system for controlling oxide growth (U.S. Patent No. 8662886). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8662886

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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