The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2014

Filed:

Apr. 14, 2010
Applicants:

Marten Jeroen Pijl, Eindhoven, NL;

Caifeng Shan, Eindhoven, NL;

LU Wang, Eindhoven, NL;

Steven Leonardus Josephus Dimphina Elisabeth Van DE Par, Eindhoven, NL;

Inventors:

Marten Jeroen Pijl, Eindhoven, NL;

Caifeng Shan, Eindhoven, NL;

Lu Wang, Eindhoven, NL;

Steven Leonardus Josephus Dimphina Elisabeth Van De Par, Eindhoven, NL;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention relates to a method of selecting an optimal viewing angle position for a camera. A first quantitative score is determined for a first viewing angle position of the camera using pre-selected regions of interest as reference areas, the determining being performed in accordance to a pre-defined quantitative score rule. The angle position is adjusted from the first viewing angle position towards at least one second viewing angle position. For each at least one second viewing angle position a second quantitative score is determined in accordance to the pre-defined quantitative score rule, and finally a target viewing angle position is determined based on the determined quantitative scores.


Find Patent Forward Citations

Loading…