The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2014
Filed:
Jan. 07, 2011
Kenneth J. Harte, Carlisle, MA (US);
Ronald P. Millman, Jr., Taunton, MA (US);
Victoria M. Chaplick, Charlton, MA (US);
David J. Elliott, Carlisle, MA (US);
Eugene O. Degenkolb, Newton, MA (US);
Murray L. Tardif, Dunstable, MA (US);
Kenneth J. Harte, Carlisle, MA (US);
Ronald P. Millman, Jr., Taunton, MA (US);
Victoria M. Chaplick, Charlton, MA (US);
David J. Elliott, Carlisle, MA (US);
Eugene O. Degenkolb, Newton, MA (US);
Murray L. Tardif, Dunstable, MA (US);
UVTech Systems, Inc., Sudbury, MA (US);
Abstract
A method and apparatus for processing substrate edges is disclosed that overcomes the limitations of conventional edge processing methods and systems used in semiconductor manufacturing. The edge processing method and apparatus of this invention includes a laser and optical system to direct a beam of radiation onto a rotating substrate supported by a chuck, in atmosphere. The optical system accurately and precisely directs the beam to remove or transform organic or inorganic films, film stacks, residues, or particles from the top edge, top bevel, apex, bottom bevel, and bottom edge of the substrate. An optional gas injector system directs gas onto the substrate edge to aid in the reaction. Process by-products are removed via an exhaust tube enveloping the reaction site. This invention permits precise control of an edge exclusion zone, resulting in an increase in the number of usable die on a wafer. Wafer edge processing with this invention replaces existing solvent and/or abrasive methods and thus will improve die yield.