The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2014
Filed:
Oct. 08, 2010
Yasushi Fukumoto, Kawasaki, JP;
Koichi Komatsu, Kawasaki, JP;
Fumihiro Takemura, Kawasaki, JP;
Sadaharu Arita, Kure, JP;
Kotaro Hirano, Kawasaki, JP;
Yasushi Fukumoto, Kawasaki, JP;
Koichi Komatsu, Kawasaki, JP;
Fumihiro Takemura, Kawasaki, JP;
Sadaharu Arita, Kure, JP;
Kotaro Hirano, Kawasaki, JP;
Mitutoyo Corporation, Kawasaki-Shi, JP;
Abstract
An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe for a surface profile measuring machine is provided. The method includes: setting on a stage a calibration jig that has a surface being provided with a lattice pattern with a level difference; measuring the lattice pattern of the calibration jig by the contact-type detector to obtain a first reference position of the lattice pattern; capturing the image of the lattice pattern of the calibration jig by the image probe to obtain a second reference position of the lattice pattern; and obtaining the offset amount from a difference between the first and second reference positions.