The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2014

Filed:

Sep. 21, 2005
Applicants:

Tadahiro Kuroda, Yokohama, JP;

Daisuke Mizoguchi, Yokohama, JP;

Noriyuki Mirua, Yokohama, JP;

Inventors:

Tadahiro Kuroda, Yokohama, JP;

Daisuke Mizoguchi, Yokohama, JP;

Noriyuki Mirua, Yokohama, JP;

Assignee:

KEIO University, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention has an object to provide an electronic circuit testing apparatus that is preferable for testing an electronic circuit which carries out communications between substrates based on inductive coupling and is capable of testing the electronic circuit without using test pads, wherein a probeis caused to intervene in a communications channel composed by inductive coupling based on the first and second transmitter coils; and the first and second receiver coils, and an LSI is tested by a tester, buffersand, and a Tx/Rx switch. Accordingly, it is not be necessary for that the electronic circuit testing apparatus is provided with a needle that touches pads and leads of the electronic circuit, and the service life there can be lengthened.


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