The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2014
Filed:
Mar. 04, 2013
Applicants:
John A. Notte, Iv, Gloucester, MA (US);
Sybren Sijbrandij, Wakefield, MA (US);
Inventors:
John A. Notte, IV, Gloucester, MA (US);
Sybren Sijbrandij, Wakefield, MA (US);
Assignee:
Carl Zeiss Microscopy, LLC, Thornwood, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/225 (2006.01); H01J 37/317 (2006.01); H01J 37/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
Ion microscope methods and systems are disclosed. In general, the systems and methods involve relatively light isotopes, minority isotopes or both. In some embodiments, an isotope of Neon is used.
Notte, IV, John. (2014). Isotope ion microscope methods and systems (U.S. Patent No. 8648299). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8648299
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile