The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2014
Filed:
May. 07, 2012
Jodi Lynn Reeves, Guilderland, NY (US);
David M. Gibson, Voorheesville, NY (US);
Walter M. Gibson, Voorheesville, NY (US);
Huapeng Huang, Latham, NY (US);
Jodi Lynn Reeves, Guilderland, NY (US);
David M. Gibson, Voorheesville, NY (US);
Walter M. Gibson, Voorheesville, NY (US);
Huapeng Huang, Latham, NY (US);
SuperPower, Inc., Schenectady, NY (US);
Abstract
A method for forming a superconductive article is disclosed. According to one method, a substrate is provided, the substrate having an aspect ratio of not less than about 1×10, forming a buffer layer overlying the substrate, forming a superconductor layer overlying the buffer layer, and characterizing at least one of the substrate, the buffer layer and the superconductor layer by x-ray diffraction. In this regard, x-ray diffraction is carried out such that data are taken at multiple phi angles. Data acquisition at multiple phi angles permits robust characterization of the film or layer subject to characterization, and such data may be utilized for process control and/or quality control. Additional methods for forming superconductive articles, and for characterizing same with XRD are also disclosed.