The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
May. 26, 2011
Haifeng Liu, Beijing, CN;
Sheng Ping Liu, Beijing, CN;
Jing Mei, Beijing, CN;
Guo Tong Xie, Beijing, CN;
LI Han Yu, Beijing, CN;
Haifeng Liu, Beijing, CN;
Sheng Ping Liu, Beijing, CN;
Jing Mei, Beijing, CN;
Guo Tong Xie, Beijing, CN;
Li Han Yu, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and a system for evaluating data. The method comprises: receiving an Object Constraint Language (OCL) expression-based evaluation request; transforming at least part of the OCL expressions in the evaluation request into query requests; querying relevant data based on the query requests; and evaluating data obtained from the querying based on the evaluation request. The present invention may support evaluation of complex OCL expressions on a mass data set.