The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2014

Filed:

Jul. 01, 2011
Applicants:

Chia-chi Tsao, Zhubei, TW;

Syun-jie Jhan, Hsinchu, TW;

Yi-cheng Shih, Zhubei, TW;

Chwen Yu, Taipei, TW;

Inventors:

Chia-Chi Tsao, Zhubei, TW;

Syun-Jie Jhan, Hsinchu, TW;

Yi-Cheng Shih, Zhubei, TW;

Chwen Yu, Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G21K 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

System and method for EMI shielding for a CD-SEM are described. One embodiment is a scanning electron microscope ('SEM') comprising an electron gun for producing an electron beam directed toward a sample; a secondary electron ('SE') detector for detecting secondary electrons reflected from the sample in response to the electron beam; and a dual-layer shield disposed around and enclosing the SE detector. The shield comprises a magnetic shielding lamina layer and a metallic foil layer.


Find Patent Forward Citations

Tsao, Chia-Chi. (2014). System and method for electromagnetic interference shielding for critical dimension-scanning electron microscope (U.S. Patent No. 8633439). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8633439

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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