The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2014

Filed:

Feb. 02, 2010
Applicants:

Brian S. Merrow, Harvard, MA (US);

Valquirio N. Carvalho, Lowell, MA (US);

John P. Toscano, Auburn, MA (US);

Inventors:

Brian S. Merrow, Harvard, MA (US);

Valquirio N. Carvalho, Lowell, MA (US);

John P. Toscano, Auburn, MA (US);

Assignee:

Teradyne, Inc., North Reading, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 11/24 (2006.01); G01L 19/14 (2006.01); G11B 27/36 (2006.01); H05K 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test rack for a storage device testing system includes a plurality of test slot carriers. Each of the test slot carriers includes a plurality of test slot assemblies. The test slot assemblies are configured to received and support storage devices for testing. The test rack also includes a chassis. The chassis includes a plurality of carrier receptacles for releasable receiving and supporting the test slot carriers. The test slot carriers are interchangeable with each other among the various carrier receptacles.


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