The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2014

Filed:

Oct. 22, 2010
Applicants:

Stephen Biellak, Sunnyvale, CA (US);

Daniel Kavaldjiev, San Jose, CA (US);

Stuart Friedman, Palo Alto, CA (US);

Inventors:

Stephen Biellak, Sunnyvale, CA (US);

Daniel Kavaldjiev, San Jose, CA (US);

Stuart Friedman, Palo Alto, CA (US);

Assignee:

KLA-Tencor Corporation, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 40/14 (2006.01); H01J 40/00 (2006.01); H01J 40/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed herein is a PhotoMultiplier Tube (PMT) designed for use with a surface inspection system such as the Surfscan system, which operates at 266 nm wavelength. The inventive PMT is high efficiency, low noise, and low gain, a combination of features that is specific to the application and contrary to the features of PMT's in the art. The inventive PMT is designed to be tuned to a specific narrow band wavelength of incident light, thereby optimizing the QE at that wavelength. It is further designed to combine a small number of dynodes each having substantially higher secondary electron gain than typical dynodes. By designing the PMT in this way, the excess noise factor is dramatically reduced, yielding a much improved S/N, while still maintaining the overall PMT gain in the lower range suitable for use in a surface inspection system.


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