The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2014

Filed:

Jun. 30, 2010
Applicants:

William Wu, Cupertino, CA (US);

Shai Traister, Sunnyvale, CA (US);

Jianmin Huang, Sunnyvale, CA (US);

Neil David Hutchison, Campbell, CA (US);

Steven Sprouse, San Jose, CA (US);

Inventors:

William Wu, Cupertino, CA (US);

Shai Traister, Sunnyvale, CA (US);

Jianmin Huang, Sunnyvale, CA (US);

Neil David Hutchison, Campbell, CA (US);

Steven Sprouse, San Jose, CA (US);

Assignee:

SanDisk Technologies Inc., Plano, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system pre-emptively perform garbage collection operations of a forced amount on update blocks in a memory device. The amount of garbage collection needed by a certain data write is monitored and adjusted to match the forced amount if necessary. Update blocks may be selected on the basis of their recent usage or the amount of garbage collection required. Another method and system may store control information about update blocks in a temporary storage area so that a greater number of update blocks are utilized. The sequential write performance measured by the Speed Class test may be optimized by using this method and system.


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