The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2013
Filed:
Jan. 27, 2011
Kenneth P. Dobyns, Beaverton, OR (US);
Kathryn A. Engholm, Portland, OR (US);
Amy M. Bergsieker, Tigard, OR (US);
Steven C. Herring, Beaverton, OR (US);
Gary J. Waldo, Hillsboro, OR (US);
Kenneth P. Dobyns, Beaverton, OR (US);
Kathryn A. Engholm, Portland, OR (US);
Amy M. Bergsieker, Tigard, OR (US);
Steven C. Herring, Beaverton, OR (US);
Gary J. Waldo, Hillsboro, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A test and measurement instrument and method for generating IQ-based time domain waveform information and presenting the IQ-based time domain waveform information together with other time domain waveform on a common axis through a user interface. The test and measurement instrument can include, for example, one or more input terminals to receive an electrical signal under test, an analog-to-digital converter (ADC) to digitize the signal under test, a digital downconverter to produce I (in-phase) and Q (quadrature) baseband component information from the digitized signal, a memory configured to store the IQ baseband component information, a user interface, and a controller. The controller can be configured to generate an IQ-based time domain waveform using the IQ baseband component information, and present the IQ-based time domain waveform and a second time domain waveform on a common axis through the user interface.