The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2013
Filed:
Oct. 01, 2008
Applicants:
Chongwu Zhou, Arcadia, CA (US);
Mark E. Thompson, Anaheim, CA (US);
Allen S. Yang, Valencia, CA (US);
Richard James Cote, Miami, FL (US);
Inventors:
Chongwu Zhou, Arcadia, CA (US);
Mark E. Thompson, Anaheim, CA (US);
Allen S. Yang, Valencia, CA (US);
Richard James Cote, Miami, FL (US);
Assignee:
University of Southern California, Los Angeles, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to various methods of detecting DNA methylation and defected DNA. In one embodiment, the invention provides a nanosensor bound to a probe that is complementary to a DNA methylation sequence.
Zhou, Chongwu. (2013). Detection of methylated dna and dna mutations (U.S. Patent No. 8609333). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8609333
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile