The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2013

Filed:

May. 29, 2012
Applicants:

Yutaka Mikawa, Ibaraki, JP;

Makiko Kiyomi, Ibaraki, JP;

Yuji Kagamitani, Ibaraki, JP;

Toru Ishiguro, Sendai, JP;

Yoshihiko Yamamura, Muroran, JP;

Inventors:

Yutaka Mikawa, Ibaraki, JP;

Makiko Kiyomi, Ibaraki, JP;

Yuji Kagamitani, Ibaraki, JP;

Toru Ishiguro, Sendai, JP;

Yoshihiko Yamamura, Muroran, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 11/00 (2006.01); C30B 35/00 (2006.01); C30B 28/06 (2006.01); C30B 19/00 (2006.01); B01J 3/04 (2006.01); B01D 9/00 (2006.01); C01B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

To provide a production method for a nitride crystal, where a nitride crystal can be prevented from precipitating in a portion other than on a seed crystal and the production efficiency of a gallium nitride single crystal grown on the seed crystal can be enhanced. In a method for producing a nitride crystal by an ammonothermal method in a vessel containing a mineralizer-containing solution, out of the surfaces of said vessel and a member provided in said vessel, at least a part of the portion coming into contact with said solution is constituted by a metal or alloy containing one or more atoms selected from the group consisting of tantalum (Ta), tungsten (W) and titanium (Ti), and has a surface roughness (Ra) of less than 1.80 μm.


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