The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8605378 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 10, 2013

Filed:

Feb. 14, 2012
Applicants:

Yoshihiro Sakurai, Kamisato, JP;

Kunihito Higa, Kamisato, JP;

Yukio Yamamoto, Hitachinaka, JP;

Inventors:

Yoshihiro Sakurai, Kamisato, JP;

Kunihito Higa, Kamisato, JP;

Yukio Yamamoto, Hitachinaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention realizes reduction of position information demodulation errors caused by the eccentricity of the magnetic disk and improvement of position signal detection accuracy, as well as enabling quick eccentricity clock correction for arbitrary clock frequencies. An inspection device in accordance with the present invention comprises: a servo demodulation unit which demodulates servo information; a PLL clock generating unit which generates a reference clock and supplies the reference clock to the servo demodulation unit; and a tester control unit. The PLL clock generating unit includes an eccentricity correction circuit for correcting the frequency of the reference clock depending on the eccentricity of the magnetic disk. The tester control unit generates correction data for correcting the frequency of the reference clock, multiplies the correction data by the inverse of a transfer function of the PLL clock generating unit, and supplies the product to the eccentricity correction circuit.


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Sakurai, Yoshihiro. (2013). Inspection device and inspection method for inspecting magnetic disk or magnetic head (U.S. Patent No. 8605378). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8605378

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