The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2013
Filed:
Feb. 12, 2010
Nicolas Raphaël Saubat, Sainte-Geneviéve-des-bois, FR;
Francois Ragnet, Venon, FR;
Philippe Rerole, Fontaine, FR;
Eric H. Cheminot, Meylan, FR;
John A. Moore, Victor, FR;
Nicolas Raphaël Saubat, Sainte-Geneviéve-des-bois, FR;
Francois Ragnet, Venon, FR;
Philippe Rerole, Fontaine, FR;
Eric H. Cheminot, Meylan, FR;
John A. Moore, Victor, FR;
Xerox Corporation, Norwalk, CT (US);
Abstract
A system, method, and apparatus for mark recognition in an image of an original document are provided. The method/system takes as input an image of an original document in which at least one designated field is provided for accepting a mark applied by a user (which may or may not have been marked). A region of interest (RoI) is extracted from the image, roughly corresponding to the designated field. A center of gravity (CoG) of the RoI is determined, based on a distribution of black pixels in the RoI. Thereafter, for one or more iterations, the RoI is partitioned into sub-RoIs, based on the determined CoG, where at a subsequent iteration, sub-RoIs generated at the prior iteration serve as the RoI partitioned. Data is extracted from the RoI and sub-RoIs at one or more of the iterations, which allows a representation of the entire RoI to be generated which is useful in classifying the designated field, e.g., as positive (marked) or negative (not marked).