The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2013
Filed:
Jan. 21, 2010
Matthias Danckwerts, Jena, DE;
Ralf Wolleschensky, Jena, DE;
Joerg Steinert, Jena, DE;
Robert Hauschild, Jena, DE;
Stefan Wilhelm, Jena, DE;
Matthias Danckwerts, Jena, DE;
Ralf Wolleschensky, Jena, DE;
Joerg Steinert, Jena, DE;
Robert Hauschild, Jena, DE;
Stefan Wilhelm, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A laser scanning microscope has an illumination beam path and a detection beam path. A beamsplitter is provided which reflects the illumination light in direction of the sample and transmits the detection light in direction of the detection arrangement. An additional beamsplitter is provided for reflecting the illumination light and for transmitting the detection light, this additional beamsplitter being arranged in the illumination beam path downstream of the first beamsplitter in the illumination direction, and this additional beamsplitter substantially transmits the illumination light reflected at the first beamsplitter and the detection light, but acquires a wavelength range substantially different from the first beamsplitter with respect to its reflectivity.