The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2013
Filed:
Feb. 28, 2011
Applicant:
Gerd Benner, Aalen, DE;
Inventor:
Gerd Benner, Aalen, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
A transmission electron microscope in which a sample is positioned in a sample planecomprises an objective lens, a first projection lens systemhaving plural lenses, a second projection lenssystem having plural lenses, and an analyzing system. The sample planeis imaged into an intermediate image plane, a diffraction planeof the objective lensis imaged into an intermediate diffraction plane, and either