The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2013

Filed:

Sep. 23, 2011
Applicants:

Paresh Chatterjee, Fremont, CA (US);

Ajit Narayanan, Fremont, CA (US);

Narayanan Balakrishnan, Milpitas, CA (US);

Raja Jayaraman, Fremont, CA (US);

Inventors:

Paresh Chatterjee, Fremont, CA (US);

Ajit Narayanan, Fremont, CA (US);

Narayanan Balakrishnan, Milpitas, CA (US);

Raja Jayaraman, Fremont, CA (US);

Assignee:

American Megatrends, Inc., Norcross, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for maintaining mirrored storage cluster data consistency can employ write-intent logging. The techniques can be scaled to any number of mirror nodes. The techniques can keep track of any outstanding I/Os, data in caches, and data that has gone out of sync between mirrored nodes due to link failures. The techniques can ensure that a power failure on any of the storage nodes does not result in inconsistent data among the storage nodes. The techniques may keep track of outstanding I/Os using a minimal memory foot-print and having a negligible impact on the I/O performance. Properly choosing the granularity of the system for tracking outstanding I/Os can result in a minimal amount of data requiring transfer to synchronize the mirror nodes. The capability to vary the granularity based on physical and logical parameters of the storage volumes may provide performance benefits.

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